Whether your application involves displays, buttons, wires, batteries, full devices, or microelectronic components and assemblies such as printed circuit boards and chips, Instron offers a wide range of testing accessories for performing tensile, compression, bend, peel, and shear tests.
Probes and Chucks
A variety of probes are available for performing compression tests on buttons, displays, and other electronic and microelectronic components. These probes are easily added to the testing system with our three-jaw chuck fixture.
Component Test Plate
The component test plate is a large plate with an array of tapped holes that is useful for securing difficult-to-test components for a variety of tensile, compression, peel or other testing.
Translation and Clamping Stages
Translation and clamping stages are used to precisely position and align a test specimen below the actuator. These are commonly used for securely positioning microelectronic circuit boards and components within the testing system.
Designed for simple, simultaneous or independent axial and torsional testing, the Torsion Add-On 3.0 increases the capabilities of your lab – allowing you to expand product development capabilities and simulate real-world applications of your products. It’s perfect for testing the performance of flexible electronics, components, buttons, wires, and more.
Digital Controller Accessories
Digital I/O boards and expansion channels can be added to universal testing frames to help interface with external equipment and measuring devices, such as voltage measuring devices.
Many electronic devices and microelectronic components are expected to withstand extreme temperatures both during the assembly process and in normal use. With an environmental chamber, you can characterize the performance of your products under a wide range of temperature conditions ranging from -100 °C to +350 °C.
Extra Wide Universal Testing Systems
The height and width of the 6800 Series table model systems can be customized to fit specific application requirements. Extra wide frames are typically preferred for testing large displays, full-sized laptops, and electronic packaging materials such as foam and plastic. The extra wide frames can also be equipped with an automated XY stage for testing larger devices, such as full-sized keyboards.