Written by Fulin Liu and Charlie Pryor

THE CHALLENGEBoard Level mechanical tests are an essential quality control test within the microelectronics packaging industry. They provide testing data to support IC components' performance against interconnect failures during shipment and in end-use products where cyclic stresses and shock from impact are experienced.

The JEDEC JESD22B113 test method is used to evaluate and compare surface mounted electronic components' performance in an accelerated test environment for handheld electronic products applications. This is done by using a specified 4-point cyclic bending test method.


The standard recommends a specimen design similar in size and layout to a drop Impact test. It specifies the spans and the cyclic amplitude, frequency, and waveform for performing this test. Interconnection failure is determined based on resistance daisy chains, typically five times the initial resistance or 1000ohms, whichever is higher. The challenge of the JEDEC JESD22B113 test that an operator must have the test system continuously generate the flexural loading based on a specified cyclic waveform on the printed wiring board (PWB) via the 4-point bend to long-time fatigue – up to 200,000 cycles at 1-3Hz frequency without lateral specimen shifting.

Instron® ElectroPuls® systems E1000, E3000, and E3000NB are the ideal test machines for micro-electronic fatigue testing. E1000, E3000, and E3000NB material testing instruments use patented linear motor technology, offer slow-speed static and high-frequency fatigue testing. It includes Instron advanced digital control electronics, Dynacell load cell, Console software, and the very latest in testing technology – hassle-free tuning based on specimen stiffness. WaveMatrix2 Dynamic Testing Software allows users to quickly and easily construct a wide range of dynamic (waveforms) and quasi-static test methods using minimal steps within a simple matrix structure.

The JEDEC B113 test fixtures CP111414 and CP118691 are specially designed in accordance with the JEDEC JESD22B113 method for performing long-time cyclic 4-point flexural fatigue tests. Easy setup of removable specimen stops is to prevent undesired drifting of the specimen during the cyclic test. As a displacement-controlled test, the fixtures are designed to allow for up to 4 PWB specimens to be tested simultaneously in one setup, which saves time.

JEDEC B113 Fixture
JEDEC B113 Fixture
CP116238 Lower Anvils & CP116241, CP116238 upper Fixture & CP116240 upper pull rod

ElectroPuls® 宣传册

ElectroPuls 仪器是先进的电子动态测试系统,用于对材料和组件进行动态和静态测试。ElectroPuls 仪器完全由单相市电电源供电,采用最新的测试技术和许多其他面向用户的功能。

Dynacell 疲劳额定载荷传感器

2527 系列载荷传感器设计用于动态测试系统;性能卓越,能够测量低至力容量 1/250 的力,精度为读数的 0.5%。自动传感器识别和电气校准功能使得它们非常易于使用。载荷传感器可承受的载荷高达力容量的 150%,而不会损坏,并且可以承受 300% 的载荷而不会出现机械故障。所有的 Instron 载荷传感器均经过单独的温度补偿,并使用可溯源至国际标准的校准设备进行了精度和可重复性测试,测量的不确定度不超过载荷传感器所允许误差的三分之一。

WaveMatrix2 宣传册

WaveMatrix2 是一款专为材料和组件的疲劳和动态测试而设计的智能软件。这款软件使用灵活 - 可运行从简单的静态斜坡、循环波形到复杂的多步多轴测试的一切。集成表格式屏幕、清晰的菜单结构、基于时间的矩阵测试预览和可配置的现场测试工作空间 - 高度可视化环境设计直观,可放心使用。具有数据减少和内置项目组织等智能功能,旨在简化您的测试。

微电子 JEDEC B113 测试工装

JEDEC JESD22B113 测试方法是通过在 1~3Hz 频率下使用指定的 4 点循环弯曲测试方法,对手持式电子产品应用评估和比较表面贴装电子元件在加速测试环境中的性能。